Power and failure analysis of CAM cells due to process variations

Authors

M Bennaser
CA Moritz

Publication Date

2006

Journal or Book Title

2006 13TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS, VOLS 1-3

DOI

https://doi.org/10.1109/ICECS.2006.379862

Pages

608-611

Recommended Citation

Bennaser, M and Moritz, CA, "Power and failure analysis of CAM cells due to process variations" (2006). 2006 13TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS, VOLS 1-3. 1015.
https://doi.org/10.1109/ICECS.2006.379862