Synchro-tokens: Eliminating nondeterminism to enable chip-level test of globally-asynchronous locally-synchronous SoC's
Publication Date
2004
Journal or Book Title
DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS
DOI
https://doi.org/10.1109/DATE.2004.1268881
Pages
410-415
Recommended Citation
Heath, MW; Burleson, WP; and Harris, IG, "Synchro-tokens: Eliminating nondeterminism to enable chip-level test of globally-asynchronous locally-synchronous SoC's" (2004). DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS. 150.
https://doi.org/10.1109/DATE.2004.1268881