Synchro-tokens: Eliminating nondeterminism to enable chip-level test of globally-asynchronous locally-synchronous SoC's

Authors

MW Heath
WP Burleson
IG Harris

Publication Date

2004

Journal or Book Title

DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS

DOI

https://doi.org/10.1109/DATE.2004.1268881

Pages

410-415

Recommended Citation

Heath, MW; Burleson, WP; and Harris, IG, "Synchro-tokens: Eliminating nondeterminism to enable chip-level test of globally-asynchronous locally-synchronous SoC's" (2004). DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS. 150.
https://doi.org/10.1109/DATE.2004.1268881