Surface roughness scattering in ultrathin-body SOI MOSFETs
Publication Date
2007
Journal or Book Title
SISPAD 2007: SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES 2007
DOI
https://doi.org/10.1007/978-3-211-72861-1_15
Pages
61-64
Recommended Citation
Jin, S; Fischetti, MV; and Tang, TW, "Surface roughness scattering in ultrathin-body SOI MOSFETs" (2007). SISPAD 2007: SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES 2007. 242.
https://doi.org/10.1007/978-3-211-72861-1_15
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