Reliability enhancement of analog-to-digital converters (ADCs)
Publication Date
2001
Journal or Book Title
2001 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
DOI
https://doi.org/10.1109/DFTVS.2001.966788
Pages
347-353
Book Series Title
IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS - PROCEEDINGS
Recommended Citation
Singh, M and Koren, I, "Reliability enhancement of analog-to-digital converters (ADCs)" (2001). 2001 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS. 774.
https://doi.org/10.1109/DFTVS.2001.966788