Reliability enhancement of analog-to-digital converters (ADCs)

Authors

M Singh
I Koren

Publication Date

2001

Journal or Book Title

2001 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS

DOI

https://doi.org/10.1109/DFTVS.2001.966788

Pages

347-353

Book Series Title

IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS - PROCEEDINGS

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