Transient fault sensitivity analysis of analog-to-digital converters (ADCs)
Publication Date
2001
Journal or Book Title
IEEE COMPUTER SOCIETY WORKSHOP ON VLSI 2001, PROCEEDINGS
DOI
https://doi.org/10.1109/IWV.2001.923153
Pages
140-145
Recommended Citation
Singh, M; Rachala, R; and Koren, I, "Transient fault sensitivity analysis of analog-to-digital converters (ADCs)" (2001). IEEE COMPUTER SOCIETY WORKSHOP ON VLSI 2001, PROCEEDINGS. 781.
https://doi.org/10.1109/IWV.2001.923153
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