Title

The effect of placement on yield for standard cell designs

Authors

RK Prasad
I Koren

Publication Date

2000

Journal or Book Title

IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS

Pages

3-11

Book Series Title

IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS - PROCEEDINGS

This document is currently not available here.

Share

COinS