Defect tolerance in VLSI circuits: Techniques and yield analysis

Authors

I Koren
Z Koren

Publication Date

1998

Journal or Book Title

PROCEEDINGS OF THE IEEE

DOI

https://doi.org/10.1109/5.705525

Pages

1819-1836

Volume

86

Issue

9

Recommended Citation

Koren, I and Koren, Z, "Defect tolerance in VLSI circuits: Techniques and yield analysis" (1998). PROCEEDINGS OF THE IEEE. 794.
https://doi.org/10.1109/5.705525