On the effect of defect clustering on test transparency and IC test optimization
Publication Date
1996
Journal or Book Title
IEEE TRANSACTIONS ON COMPUTERS
DOI
https://doi.org/10.1109/12.506431
Pages
753-757
Volume
45
Issue
6
Recommended Citation
Singh, AD and Krishna, CM, "On the effect of defect clustering on test transparency and IC test optimization" (1996). IEEE TRANSACTIONS ON COMPUTERS. 859.
https://doi.org/10.1109/12.506431
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