Improving Yield and Reliability of Chip Multiprocessors
Publication Date
2009
Journal or Book Title
DATE: 2009 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3
DOI
https://doi.org/10.1109/DATE.2009.5090714
Pages
490-495
Book Series Title
Design, Automation and Test in Europe Conference and Expo
Recommended Citation
Pan, A; Khan, O; and Kundu, S, "Improving Yield and Reliability of Chip Multiprocessors" (2009). DATE: 2009 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3. 892.
https://doi.org/10.1109/DATE.2009.5090714