A Low Cost Scheme for Reducing Silent Data Corruption in Large Arithmetic Circuits
Journal or Book Title
23RD IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
Book Series Title
IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Pan, A; Tschanz, JW; and Kundu, S, "A Low Cost Scheme for Reducing Silent Data Corruption in Large Arithmetic Circuits" (2008). Electrical and Computer Engineering Faculty Publication Series. 903.
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