"On modeling and testing of lithography related open faults in nano-CMO" by A Sreedhar, A Sanyal et al.

Electrical and Computer Engineering Faculty Publication Series

On modeling and testing of lithography related open faults in nano-CMOS circuits

A Sreedhar
A Sanyal
S Kundu

2008

533-538

2008 DESIGN, AUTOMATION AND TEST IN EUROPE, VOLS 1-3

Design, Automation and Test in Europe Conference and Expo

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