On modeling and testing of lithography related open faults in nano-CMOS circuits
Journal or Book Title
2008 DESIGN, AUTOMATION AND TEST IN EUROPE, VOLS 1-3
Book Series Title
Design, Automation and Test in Europe Conference and Expo
Sreedhar, A; Sanyal, A; and Kundu, S, "On modeling and testing of lithography related open faults in nano-CMOS circuits" (2008). Electrical and Computer Engineering Faculty Publication Series. 906.
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