A bluilt-in self-test scheme for soft error rate characterization

Authors

A Sanyal
SM Alam
S Kundu

Publication Date

2008

Journal or Book Title

14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS

DOI

https://doi.org/10.1109/IOLTS.2008.26

Pages

65-70

Recommended Citation

Sanyal, A; Alam, SM; and Kundu, S, "A bluilt-in self-test scheme for soft error rate characterization" (2008). 14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS. 907.
https://doi.org/10.1109/IOLTS.2008.26