A built-in test and characterization method for circuit marginality related failures
Publication Date
2008
Journal or Book Title
ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN
DOI
https://doi.org/10.1109/ISQED.2008.4479847
Pages
838-843
Recommended Citation
Sanyal, A and Kundu, S, "A built-in test and characterization method for circuit marginality related failures" (2008). ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN. 911.
https://doi.org/10.1109/ISQED.2008.4479847
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