Stress-induced deceleration of electromigration-driven void motion in metallic thin films
Publication Date
2007
Journal or Book Title
JOURNAL OF APPLIED PHYSICS
DOI
https://doi.org/10.1063/1.2709616
Pages
-
Volume
101
Issue
6
Recommended Citation
Gungor, MR and Maroudas, D, "Stress-induced deceleration of electromigration-driven void motion in metallic thin films" (2007). JOURNAL OF APPLIED PHYSICS. 335.
https://doi.org/10.1063/1.2709616
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