Electromigration-induced wave propagation on surfaces of voids in metallic thin films: Hopf bifurcation for high grain symmetry

Authors

J Cho
MR Gungor
D Maroudas

Publication Date

2005

Journal or Book Title

SURFACE SCIENCE

DOI

https://doi.org/10.1016/j.susc.2004.11.011

Pages

L41-L50

Volume

575

Issue

1-2

Recommended Citation

Cho, J; Gungor, MR; and Maroudas, D, "Electromigration-induced wave propagation on surfaces of voids in metallic thin films: Hopf bifurcation for high grain symmetry" (2005). SURFACE SCIENCE. 362.
https://doi.org/10.1016/j.susc.2004.11.011