Data Memory Subsystem Resilient to Process Variations
Publication Date
2008
Journal or Book Title
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
DOI
https://doi.org/10.1109/TVLSI.2008.2001299
Pages
1631-1638
Volume
16
Issue
12
Recommended Citation
Bennaser, M; Guo, Y; and Moritz, CA, "Data Memory Subsystem Resilient to Process Variations" (2008). IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. 1010.
https://doi.org/10.1109/TVLSI.2008.2001299
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