Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits
Publication Date
2004
Journal or Book Title
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
DOI
https://doi.org/10.1109/TVLSI.2004.824302
Pages
299-311
Volume
12
Issue
3
Recommended Citation
Maheshwari, A; Burleson, W; and Tessier, R, "Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits" (2004). IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. 155.
https://doi.org/10.1109/TVLSI.2004.824302
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