Techniques for transient fault sensitivity analysis and reduction in VLSI circuits

Authors

A Maheshwari
I Koren
W Burleson

Publication Date

2003

Journal or Book Title

18TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS

DOI

https://doi.org/10.1109/DFTVS.2003.1250160

Pages

597-604

Book Series Title

IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS - PROCEEDINGS

Recommended Citation

Maheshwari, A; Koren, I; and Burleson, W, "Techniques for transient fault sensitivity analysis and reduction in VLSI circuits" (2003). 18TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS. 161.
https://doi.org/10.1109/DFTVS.2003.1250160