Techniques for transient fault sensitivity analysis and reduction in VLSI circuits
Publication Date
2003
Journal or Book Title
18TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
DOI
https://doi.org/10.1109/DFTVS.2003.1250160
Pages
597-604
Book Series Title
IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS - PROCEEDINGS
Recommended Citation
Maheshwari, A; Koren, I; and Burleson, W, "Techniques for transient fault sensitivity analysis and reduction in VLSI circuits" (2003). 18TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS. 161.
https://doi.org/10.1109/DFTVS.2003.1250160