Surface roughness scattering in ultrathin-body SOI MOSFETs

Authors

S Jin
MV Fischetti
TW Tang

Publication Date

2007

Journal or Book Title

SISPAD 2007: SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES 2007

DOI

https://doi.org/10.1007/978-3-211-72861-1_15

Pages

61-64

Recommended Citation

Jin, S; Fischetti, MV; and Tang, TW, "Surface roughness scattering in ultrathin-body SOI MOSFETs" (2007). SISPAD 2007: SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES 2007. 242.
https://doi.org/10.1007/978-3-211-72861-1_15