Modeling of surface-roughness scattering in ultrathin-body SOI MOSFETs
Publication Date
2007
Journal or Book Title
IEEE TRANSACTIONS ON ELECTRON DEVICES
DOI
https://doi.org/10.1109/TED.2007.902712
Pages
2191-2203
Volume
54
Issue
9
Recommended Citation
Jin, SH; Fischetti, MV; and Tang, TW, "Modeling of surface-roughness scattering in ultrathin-body SOI MOSFETs" (2007). IEEE TRANSACTIONS ON ELECTRON DEVICES. 246.
https://doi.org/10.1109/TED.2007.902712
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