Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters
Publication Date
2003
Journal or Book Title
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
DOI
https://doi.org/10.1109/TVLSI.2003.812376
Pages
839-852
Volume
11
Issue
5
Recommended Citation
Singh, M and Koren, I, "Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters" (2003). IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. 770.
https://doi.org/10.1109/TVLSI.2003.812376
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