Advanced fault-tolerance techniques for a color digital camera-on-a-chip

Authors

I Koren
G Chapman
Z Koren

Publication Date

2001

Journal or Book Title

2001 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS

DOI

https://doi.org/10.1109/DFTVS.2001.966746

Pages

3-10

Book Series Title

IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS - PROCEEDINGS

Recommended Citation

Koren, I; Chapman, G; and Koren, Z, "Advanced fault-tolerance techniques for a color digital camera-on-a-chip" (2001). 2001 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS. 775.
https://doi.org/10.1109/DFTVS.2001.966746