Transient fault sensitivity analysis of analog-to-digital converters (ADCs)

Authors

M Singh
R Rachala
I Koren

Publication Date

2001

Journal or Book Title

IEEE COMPUTER SOCIETY WORKSHOP ON VLSI 2001, PROCEEDINGS

DOI

https://doi.org/10.1109/IWV.2001.923153

Pages

140-145

Recommended Citation

Singh, M; Rachala, R; and Koren, I, "Transient fault sensitivity analysis of analog-to-digital converters (ADCs)" (2001). IEEE COMPUTER SOCIETY WORKSHOP ON VLSI 2001, PROCEEDINGS. 781.
https://doi.org/10.1109/IWV.2001.923153