ON OPTIMIZING VLSI TESTING FOR PRODUCT QUALITY USING DIE-YIELD PREDICTION
Publication Date
1993
Journal or Book Title
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
DOI
https://doi.org/10.1109/43.277614
Pages
695-709
Volume
12
Issue
5
Recommended Citation
SINGH, AD and Krishna, CM, "ON OPTIMIZING VLSI TESTING FOR PRODUCT QUALITY USING DIE-YIELD PREDICTION" (1993). IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. 868.
https://doi.org/10.1109/43.277614
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