"OPTIMAL SCHEDULING OF SIGNATURE ANALYSIS FOR VLSI TESTING" by YH LEE and CM Krishna

Electrical and Computer Engineering Faculty Publication Series

Title

OPTIMAL SCHEDULING OF SIGNATURE ANALYSIS FOR VLSI TESTING

Authors

YH LEE
CM Krishna

Publication Date

1991

Journal or Book Title

IEEE TRANSACTIONS ON COMPUTERS

DOI

https://doi.org/10.1109/TEST.1988.207755

Pages

336-341

Volume

Issue

Recommended Citation

LEE, YH and Krishna, CM, "OPTIMAL SCHEDULING OF SIGNATURE ANALYSIS FOR VLSI TESTING" (1991). IEEE TRANSACTIONS ON COMPUTERS. 873.
https://doi.org/10.1109/TEST.1988.207755

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