Improving Yield and Reliability of Chip Multiprocessors

Authors

A Pan
O Khan
S Kundu

Publication Date

2009

Journal or Book Title

DATE: 2009 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3

DOI

https://doi.org/10.1109/DATE.2009.5090714

Pages

490-495

Book Series Title

Design, Automation and Test in Europe Conference and Expo

Recommended Citation

Pan, A; Khan, O; and Kundu, S, "Improving Yield and Reliability of Chip Multiprocessors" (2009). DATE: 2009 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3. 892.
https://doi.org/10.1109/DATE.2009.5090714