An Automatic Post Silicon Clock Tuning System for Improving System Performance based on Tester Measurements

Authors

K Nagaraj
S Kundu

Publication Date

2008

Journal or Book Title

2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS

DOI

https://doi.org/10.1109/TEST.2008.4700565

Pages

158-165

Book Series Title

INTERNATIONAL TEST CONFERENCE, PROCEEDINGS

This document is currently not available here.

Share

COinS