An Automatic Post Silicon Clock Tuning System for Improving System Performance based on Tester Measurements
Publication Date
2008
Journal or Book Title
2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS
DOI
https://doi.org/10.1109/TEST.2008.4700565
Pages
158-165
Book Series Title
INTERNATIONAL TEST CONFERENCE, PROCEEDINGS
Recommended Citation
Nagaraj, K and Kundu, S, "An Automatic Post Silicon Clock Tuning System for Improving System Performance based on Tester Measurements" (2008). 2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS. 896.
https://doi.org/10.1109/TEST.2008.4700565