A Low Cost Scheme for Reducing Silent Data Corruption in Large Arithmetic Circuits

Authors

A Pan
JW Tschanz
S Kundu

Publication Date

2008

Journal or Book Title

23RD IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS

DOI

https://doi.org/10.1109/DFT.2008.42

Pages

343-351

Book Series Title

IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Recommended Citation

Pan, A; Tschanz, JW; and Kundu, S, "A Low Cost Scheme for Reducing Silent Data Corruption in Large Arithmetic Circuits" (2008). 23RD IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS. 903.
https://doi.org/10.1109/DFT.2008.42