On detection of resistive bridging defects by low-temperature and low-voltage testing

Authors

P Engelke
I Polian
M Renovell
S Kundu
B Seshadri
B Becker

Publication Date

2008

Journal or Book Title

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

DOI

https://doi.org/10.1109/ATS.2005.83

Pages

327-338

Volume

27

Issue

2

Recommended Citation

Engelke, P; Polian, I; Renovell, M; Kundu, S; Seshadri, B; and Becker, B, "On detection of resistive bridging defects by low-temperature and low-voltage testing" (2008). IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. 913.
https://doi.org/10.1109/ATS.2005.83