On estimating impact of loading effect on leakage current in sub-65nm scaled CMOS circuits based on Newton-Raphson method
Publication Date
2007
Journal or Book Title
2007 44TH ACM/IEEE DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2
DOI
https://doi.org/10.1145/1278480.1278658
Pages
712-715
Book Series Title
DESIGN AUTOMATION CONFERENCE
Recommended Citation
Rastogi, A; Chen, W; and Kundu, S, "On estimating impact of loading effect on leakage current in sub-65nm scaled CMOS circuits based on Newton-Raphson method" (2007). 2007 44TH ACM/IEEE DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2. 919.
https://doi.org/10.1145/1278480.1278658
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