Koren, Israel

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Professor, Department of Electrical & Computer Engineering
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Electrical and Computer Engineering
Fault - tolerant systems, VLSI yield and reliability, and Digital computer arithmeti
Israel Koren received the B.Sc., M.Sc. and D.Sc. degrees from the Technion - Israel Institute of Technology, Haifa, in 1967, 1970, and 1975, respectively, all in Electrical Engineering. He is currently a Professor of Electrical and Computer Engineering at the University of Massachusetts, Amherst. Previously he held positions with the Technion - Israel Institute of Technology, Haifa, the University of California at Berkeley, the University of Southern California, Los Angeles and the University of California, Santa Barbara. He has been a consultant to several companies including Analog Devices, AMD, Digital Equipment Corp., IBM, Intel, National Semiconductor and Tolerant Systems.
Dr. Koren's current research interests are Fault-Tolerant Systems, VLSI Yield and Reliability, Secure Cryptographic Systems, and Computer Arithmetic. He publishes extensively and has over 250 publications in refereed journals and conferences. He is an Associate Editor of the VLSI Design Journal, and the IEEE Computer Architecture Letters. He has been a Co-Guest Editor for several IEEE Transactions on Computers special issues on Fault Diagnosis and Tolerance in Cryptography, Sept. 2006, on Computer Arithmetic, July 2000, and on High Yield VLSI Systems, April 1989. He served on the Editorial Board of these Transactions during 1992-1997, and on the Editorial Board of the IEEE Transactions on VLSI Systems during 2001-2006. He also served as General Chair, Program Chair and Program Committee member for numerous conferences. He has edited and co-authored the book, Defect and Fault-Tolerance in VLSI Systems, Vol. 1, Plenum, 1989. He is the author of the textbook Computer Arithmetic Algorithms, Second Edition, A. K. Peters, Natick, MA, 2002. He is a co-author of the textbook Fault-Tolerant Systems,, Morgan-Kaufman, San Francisco, CA, 2007. Dr. Koren is a Fellow of the IEEE.

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