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Synchro-tokens: Eliminating nondeterminism to enable chip-level test of globally-asynchronous locally-synchronous SoC's
Heath, MW
;
Burleson, WP
;
Harris, IG
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article
Date
2004-01
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https://hdl.handle.net/20.500.14394/20931
DOI
10.1109/DATE.2004.1268881
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Electrical and Computer Engineering Faculty Publication Series
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