Publication

Microstructure analysis of epitaxially grown self-assembled Ge islands on nanometer-scale patterned SiO2/Si substrates by high-resolution transmission electron microscopy

Citations
Altmetric:
Abstract
Type
article
article
Date
2007-01-01
Publisher
Degree
Advisors
License
License
Research Projects
Organizational Units
Journal Issue
Embargo Lift Date
URI
https://hdl.handle.net/20.500.14394/42201
DOI
Publisher Version
Embedded videos
Collections
Polymer Science and Engineering Department Faculty Publication Series
Load more
Related Item(s)
Show all metadata