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On detection of resistive bridging defects by low-temperature and low-voltage testing
Engelke, P
;
Polian, I
;
Renovell, M
;
Kundu, S
;
Seshadri, B
;
Becker, B
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2008-01-01
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https://hdl.handle.net/20.500.14394/21600
DOI
https://doi.org/10.1109/ATS.2005.83
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Electrical and Computer Engineering Faculty Publication Series
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