Far From Threshold Buckling Analysis of Thin Films

Authors

B Davidovitch, University of Massachusetts - AmherstFollow
R Schroll, University of Massachusetts - Amherst

Publication Date

2010

Abstract

Thin films buckle easily and form wrinkled states in regions of well defined size. The extent of a wrinkled region is typically assumed to reflect the zone of in-plane compressive stresses prior to buckling, but recent experiments on ultrathin sheets have shown that wrinkling patterns are signif- icantly longer and follow different scaling laws than those predicted by standard buckling theory. Here we focus on a simple setup to show the striking differences between near-threshold buckling and the analysis of wrinkle patterns in very thin films, which are typically far from threshold.

Comments

This is the pre-published version harvested from ArXiv.

Recommended Citation

Davidovitch, B and Schroll, R, "Far From Threshold Buckling Analysis of Thin Films" (2010). Physics Department Faculty Publication Series. 1102.
Retrieved from https://scholarworks.umass.edu/physics_faculty_pubs/1102