Far From Threshold Buckling Analysis of Thin Films
Thin films buckle easily and form wrinkled states in regions of well defined size. The extent of a wrinkled region is typically assumed to reflect the zone of in-plane compressive stresses prior to buckling, but recent experiments on ultrathin sheets have shown that wrinkling patterns are signif- icantly longer and follow different scaling laws than those predicted by standard buckling theory. Here we focus on a simple setup to show the striking differences between near-threshold buckling and the analysis of wrinkle patterns in very thin films, which are typically far from threshold.
Davidovitch, B and Schroll, R, "Far From Threshold Buckling Analysis of Thin Films" (2010). Physics Department Faculty Publication Series. 1102.
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