Characterization of ordered mesoporous silica films using small-angle neutron scattering and X-ray porosimetry
Publication Date
2005
Journal or Book Title
CHEMISTRY OF MATERIALS
Pages
1398-1408
Volume
17
Issue
6
Recommended Citation
Vogt, BD; Pai, RA; Lee, HJ; Hedden, RC; Soles, CL; Wu, WL; Lin, EK; Bauer, BJ; and Watkins, JJ, "Characterization of ordered mesoporous silica films using small-angle neutron scattering and X-ray porosimetry" (2005). CHEMISTRY OF MATERIALS. 1097.
Retrieved from https://scholarworks.umass.edu/pse_faculty_pubs/1097
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