Characterization of ordered mesoporous silica films using small-angle neutron scattering and X-ray porosimetry

Authors

BD Vogt
RA Pai
HJ Lee
RC Hedden
CL Soles
WL Wu
EK Lin
BJ Bauer
JJ Watkins

Publication Date

2005

Journal or Book Title

CHEMISTRY OF MATERIALS

Pages

1398-1408

Volume

17

Issue

6

Recommended Citation

Vogt, BD; Pai, RA; Lee, HJ; Hedden, RC; Soles, CL; Wu, WL; Lin, EK; Bauer, BJ; and Watkins, JJ, "Characterization of ordered mesoporous silica films using small-angle neutron scattering and X-ray porosimetry" (2005). CHEMISTRY OF MATERIALS. 1097.
Retrieved from https://scholarworks.umass.edu/pse_faculty_pubs/1097