First-principles theoretical analysis of sequential hydride dissociation on surfaces of silicon thin films

Singh, TValipa, MSMountziaris, TJMaroudas, D2024-04-262024-04-26200710.1063/1.2746945https://hdl.handle.net/20.500.14394/5732First-principles theoretical analysis of sequential hydride dissociation on surfaces of silicon thin filmsarticle