Moritz, CAWang, TNarayanan, PLeuchtenburg, MGuo, YDezan, CBermaser, M2024-04-262024-04-262007-0110.1109/TCSI.2007.907839https://hdl.handle.net/20.500.14394/20723defect tolerance, fault tolerance, nanoscale fabrics, nanoscale processors, nanoscale application specific integrated circuit (NASIC), semiconductor nanowires (NWs),Fault-tolerant nanoscale processors on semiconductor nanowire gridsarticle