Advanced fault-tolerance techniques for a color digital camera-on-a-chip
Publication Date
2001
Journal or Book Title
2001 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
DOI
https://doi.org/10.1109/DFTVS.2001.966746
Pages
3-10
Book Series Title
IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS - PROCEEDINGS
Recommended Citation
Koren, I; Chapman, G; and Koren, Z, "Advanced fault-tolerance techniques for a color digital camera-on-a-chip" (2001). 2001 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS. 775.
https://doi.org/10.1109/DFTVS.2001.966746