A UNIFIED NEGATIVE-BINOMIAL DISTRIBUTION FOR YIELD ANALYSIS OF DEFECT-TOLERANT CIRCUITS
Publication Date
1993
Journal or Book Title
IEEE TRANSACTIONS ON COMPUTERS
DOI
https://doi.org/10.1109/12.277291
Pages
724-734
Volume
42
Issue
6
Recommended Citation
Koren, I; KOREN, Z; and STAPPER, CH, "A UNIFIED NEGATIVE-BINOMIAL DISTRIBUTION FOR YIELD ANALYSIS OF DEFECT-TOLERANT CIRCUITS" (1993). IEEE TRANSACTIONS ON COMPUTERS. 806.
https://doi.org/10.1109/12.277291
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