Off-campus UMass Amherst users: To download dissertations, please use the following link to log into our proxy server with your UMass Amherst user name and password.
Non-UMass Amherst users, please click the view more button below to purchase a copy of this dissertation from Proquest.
(Some titles may also be available free of charge in our Open Access Dissertation Collection, so please check there first.)
Tensor permittivity measurements of anisotropic dielectric films at millimeter wavelengths
Abstract
A modified quasi-optical open-cavity resonator technique has been developed for the complete characterization of an anisotropic film in terms of a permittivity tensor at millimeter wavelengths. A quasi-optical Fabry-Perot cavity has been used in determining the dielectric constants $\epsilon\sb{xx}$ and $\epsilon\sb{yy}$ on the film plane of a sample suspended on the maximum electric field plane. Also a three-reflector folded open-cavity resonator has been designed in such a way that the electric field on the surface of the flat reflector is perpendicular to the surface and the measurement of $\epsilon\sb{zz}$ can be performed by mounting the thin sample directly on the flat reflector. A small loop antenna has been employed to couple millimeter wave energy into and out of the resonator with adjustable coupling level. Several dielectric materials have been measured by this technique and results at 94 GHz are presented in this dissertation.
Subject Area
Electrical engineering
Recommended Citation
Zhao, Jingfu, "Tensor permittivity measurements of anisotropic dielectric films at millimeter wavelengths" (1990). Doctoral Dissertations Available from Proquest. AAI9035425.
https://scholarworks.umass.edu/dissertations/AAI9035425