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Binary ROCs and Their Implications for the Measurement of Memory

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dc.contributor.advisorCaren M. Rotello
dc.contributor.advisorJeffrey J. Starns
dc.contributor.advisorRebecca E. Ready
dc.contributor.authorDube, Chad
dc.contributor.departmentUniversity of Massachusetts Amherst
dc.date2023-09-23T04:49:54.000
dc.date.accessioned2024-04-26T19:49:36Z
dc.date.available2024-04-26T19:49:36Z
dc.date.issued2011-09-01
dc.description.abstractBröder and Schütz (2009) have argued that the curvature typically observed in recognition memory receiver-operating characteristics (ROCs) is a by-product of the ratings task often used to obtain them. According to those authors, ROCs collected by experimentally manipulating response bias are linear and consistent with the assumptions of threshold and multinomial processing tree (MPT) models. Two experiments are reported which are broadly consistent with previous work by Dube and Rotello (under review) in showing that ROCs are curved and consistent with signal detection theory (SDT) regardless of the procedure used to obtain them. These results have implications for how accuracy is measured in tasks requiring binary responses. It is suggested that the use of statistics consistent with the assumptions of threshold models (e.g. percent correct, hits minus false alarms) should be avoided, as they are likely to produce statistical errors in several areas of the literature where ROCs have been found to be curved (Rotello, Masson, & Verde, 2008; Dube, Rotello, & Heit, 2010; 2011). SDT-based measures and ROC analysis are recommended to complement or replace analyses based on threshold statistics.
dc.description.degreeDoctor of Philosophy (PhD)
dc.description.departmentPsychology
dc.identifier.doihttps://doi.org/10.7275/2387694
dc.identifier.urihttps://hdl.handle.net/20.500.14394/38885
dc.relation.urlhttps://scholarworks.umass.edu/cgi/viewcontent.cgi?article=1445&context=open_access_dissertations&unstamped=1
dc.source.statuspublished
dc.subjectPsychology
dc.titleBinary ROCs and Their Implications for the Measurement of Memory
dc.typedissertation
dc.typearticle
dc.typedissertation
digcom.contributor.authorisAuthorOfPublication|email:chaddube@gmail.com|institution:University of Massachusetts Amherst|Dube, Chad
digcom.identifieropen_access_dissertations/439
digcom.identifier.contextkey2387694
digcom.identifier.submissionpathopen_access_dissertations/439
dspace.entity.typePublication
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